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Offset Spatulas

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Objective: Using phase measuring profilometry (PMP) to measure the object with specular reflections is a very challenging task. a large deviation between the measured result and the actual data is caused by the highlights of the measured object surface. Therefore. a 3D measurement method for the object with a specular reflection based on adaptive fringe pattern projection (AFPP) is pr... https://www.infonoticiasgandia.com/product-category/offset-spatulas/
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