Stress imbalance significantly affects the performance of a press-pack insulated gate bipolar transistor (IGBT). Time-variant loads and conditions lead to the stress fluctuations. exacerbating the impacts. The conventional reliability optimization faces efficiency barriers due to the nested time-variant reliability analysis and design optimization. https://www.roneverhart.com/1915-Old-Taylor-Bourbon-Bottled-1933-Prohibition-Bottling-Quart-low-fill/